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[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Optimizing the flattened test-generation model for very large designs
Wohl, P., Waicukauski, J.Year:
2000
Language:
english
DOI:
10.1109/test.2000.894263
File:
PDF, 845 KB
english, 2000