[IEEE 2004 IEEE International Conference on Semiconductor Electronics - Kuala Lumpur, Malaysia (2004.12.7-2004.12.9)] 2004 IEEE International Conference on Semiconductor Electronics - A study on signature analyzer for design for test (DFT)
Abu Khari bin A'ain,, Lim, C.T., Kok Hong Ng,, Sheng Kwang Ng,, Liew Eng Yew,Year:
2004
Language:
english
DOI:
10.1109/smelec.2004.1620855
File:
PDF, 1.27 MB
english, 2004