Status and review of two-dimensional carrier and dopant...

Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy

De Wolf, P., Stephenson, R., Trenkler, T., Clarysse, T., Hantschel, T., Vandervorst, W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
18
Year:
2000
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.591198
File:
PDF, 350 KB
english, 2000
Conversion to is in progress
Conversion to is failed