Characterization of Ni/Ge/Au/Ni/Au contact metallization on AlGaAsInGaAs heterostructures for pseudomorphic heterojunction field effect transistor application
H.J. Lee, M.S. Tse, K. Radhakrishnan, K. Prasad, J. Weng, S.F. Yoon, X. Zhou, H.S. TanVolume:
35
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0921-5107(95)01413-6
File:
PDF, 447 KB
english, 1995