[IEEE IEEE 7th International Conference on Properties and Applications of Dielectric Materials - Nagoya, Japan (1-5 June 2003)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat. No.03CH37417) - Dielectric characterization of polycrystalline and epitaxial thin-film CaCu/sub 3/Ti/sub 4/O/sub 12/ (CCTO)

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