[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operations
Zou, Jibin, Wang, Runsheng, Gong, Nanbo, Huang, Ru, Xu, Xiaoqing, Ou, Jiaojiao, Liu, Changze, Wang, Jianping, Liu, Jinhua, Wu, Jingang, Yu, Shaofeng, Ren, Pengpeng, Wu, Hanming, Lee, Shiuh-Wuu, Wang,Year:
2012
Language:
english
DOI:
10.1109/vlsit.2012.6242500
File:
PDF, 1.20 MB
english, 2012