![](/img/cover-not-exists.png)
ANALYZING MULTIPLE FAULTS IN SYNCHRONOUS SEQUENTIAL CIRCUITS BY BOOLEAN DIFFERENCE TECHNIQUES
Das, Sunil R., Nayak, Amiya R., Nguyen, ThiepVolume:
21
Language:
english
Journal:
Cybernetics and Systems
DOI:
10.1080/01969729008902253
Date:
July, 1990
File:
PDF, 206 KB
english, 1990