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Characterization of GaAs/(GaAs)n(AlAs)m surface-emitting laser structures through reflectivity and high-resolution electron microscopy measurements
Faist, J., Ganière, J.-D., Buffat, Ph., Sampson, S., Reinhart, F.-K.Volume:
66
Year:
1989
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.343488
File:
PDF, 1.33 MB
english, 1989