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Role of immersion time on the properties of SILAR deposited CuO thin films
Ravichandran, A. T., Dhanabalan, K., Valanarasu, S., Vasuhi, A., Kathalingam, A.Volume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-014-2483-0
Date:
February, 2015
File:
PDF, 1.20 MB
english, 2015