Submicron trenching of semiconductor nanostructures
Lee, K. Y., Smith, T. P., Ford, C. J. B., Hansen, W., Knoedler, C. M., Hong, J. M., Kern, D. P.Volume:
55
Year:
1989
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.101805
File:
PDF, 652 KB
english, 1989