Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2011 Vol. 29; Iss. 4
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Streamlined inexpensive integration of a growth facility and scanning tunneling microscope for in-situ characterization
Xu, P., Qi, D., Barber, S. D., Cook, C. T., Ackerman, M. L., Thibado, P. M.Volume:
29
Year:
2011
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3607606
File:
PDF, 452 KB
english, 2011