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Defect mechanisms in the In2O3(ZnO)k system (k = 3, 5, 7, 9)
Mitchell Hopper, E., Peng, Haowei, Hawks, Steven A., Freeman, Arthur J., Mason, Thomas O.Volume:
112
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4764924
File:
PDF, 609 KB
english, 2012