Defect reduction by periodic SiN[sub x] interlayers in gallium nitride grown on Si (111)
Zang, K. Y., Wang, Y. D., Wang, L. S., Chow, S. Y., Chua, S. J.Volume:
101
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2724793
File:
PDF, 578 KB
english, 2007