Bragg diffraction using a 100 ps 17.5 keV x-ray backlighter and the Bragg diffraction imager
Maddox, B. R., Park, H.-S., Hawreliak, J., Elsholz, A., Van Maren, R., Remington, B. A., Comley, A., Wark, J. S.Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3491295
File:
PDF, 485 KB
english, 2010