Effect of relative vapor pressure on separation of...

Journal of Applied Physics 2010 Vol. 108; Iss. 11

Effect of relative vapor pressure on separation of nanoscale contact in atomic force microscope

Kim, Doo-In, Jeong, Young-Keun, Kang, Myung-Chang, Ahn, Hyo-Sok, Kim, Kwang Ho
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Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3518682
File:
PDF, 1.17 MB
english, 2010
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