[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Probabilistic Analysis of a Molecular Quantum-Dot Cellular Automata Adder
Dysart, Timothy J., Kogge, Peter M.Year:
2007
Language:
english
DOI:
10.1109/dft.2007.39
File:
PDF, 375 KB
english, 2007