A Quantitative Theory of 1/ f Type Noise Due to Interface States in Thermally Oxidized Silicon
Nicollian, E. H., Melchior, H.Volume:
46
Language:
english
Journal:
Bell System Technical Journal
DOI:
10.1002/j.1538-7305.1967.tb04241.x
Date:
November, 1967
File:
PDF, 5.26 MB
english, 1967