[IEEE 2006 64th Device Research Conference - State College,...

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[IEEE 2006 64th Device Research Conference - State College, PA, USA (2006.06.26-2006.06.28)] 2006 64th Device Research Conference - Measurement of Minority Carrier Diffusion Lengths in Semiconductor Nanowires

Allen, Jonathan, Gu, Yi, Romankiewicz, John, Lensch, Jessica, May, Steven, Odom, Teri, Wessels, Bruce, Lauhon, Lincoln
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Year:
2006
Language:
english
DOI:
10.1109/drc.2006.305186
File:
PDF, 1.72 MB
english, 2006
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