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[IEEE 2013 17th IEEE Workshop on Signal and Power Integrity (SPI) - Paris, France (2013.05.12-2013.05.15)] 2013 17th IEEE Workshop on Signal and Power Integrity - 3D modeling in PCI Express Gen1 and Gen2 high-speed SI simulation
Runjing Zhou,, Jinsong Hu,Year:
2013
Language:
english
DOI:
10.1109/sapiw.2013.6558321
File:
PDF, 1.44 MB
english, 2013