[IEEE 2008 Annual Reliability and Maintainability Symposium...

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[IEEE 2008 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (2008.01.28-2008.01.31)] 2008 Annual Reliability and Maintainability Symposium - An integrated maintenance management information system is the key to enabling condition based maintenance

Sautter, F. Chris, Jemison, Patrick W., Goes, Christopher M., Wooten, Jerod M.
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Year:
2008
Language:
english
DOI:
10.1109/rams.2008.4925848
File:
PDF, 1.08 MB
english, 2008
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