[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - A Fast and Accurate approach for Full Chip Leakage Analysis of Nano-scale circuits considering Intra-die Correlations

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