[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - The advanced pattern designs with electrical test methodologies on through silicon via for CMOS image sensor
Chung, Hsien, Ni, Ching-Yu, Tu, Che-Min, Chang, Yu-Yao, Haung, Yao-Te, Chen, Wei-Ming, Lou, Bai-Yao, Tseng, Kun-Fu, Lee, Chih-Yuan, Lwo, Ben-JeYear:
2010
Language:
english
DOI:
10.1109/ectc.2010.5490958
File:
PDF, 1.59 MB
english, 2010