![](/img/cover-not-exists.png)
Temperature dependence on dry etching of Al[sub 2]O[sub 3] thin films in BCl[sub 3]/Cl[sub 2]/Ar plasma
Yang, Xue, Kim, Dong-Pyo, Um, Doo-Seung, Kim, Gwan-Ha, Kim, Chang-IlVolume:
27
Year:
2009
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.3086642
File:
PDF, 920 KB
english, 2009