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[IEEE 1992 42nd Electronic Components & Technology Conference - San Diego, CA, USA (18-20 May 1992)] 1992 Proceedings 42nd Electronic Components & Technology Conference - Correlation of thickness measurements obtained from cross-sectioning and from X-ray fluorescence spectrometry
Trabado, F.L., Mendoza, J.S.Year:
1992
Language:
english
DOI:
10.1109/ectc.1992.204186
File:
PDF, 454 KB
english, 1992