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[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Back-End-of-Line Defect Analysis for Rnv8T Nonvolatile SRAM
Bai, Bing-Chuan, Hsu, Chun-Lung, Wu, Ming-Hsueh, Chen, Chen-An, Chen, Yee-Wen, Luo, Kun-Lun, Cheng, Liang-Chia, Li, James C.M.Year:
2013
Language:
english
DOI:
10.1109/ats.2013.32
File:
PDF, 468 KB
english, 2013