Ultrahigh-vacuum scanning electron microscopy...

Ultrahigh-vacuum scanning electron microscopy characterization of the growth of Fe on CaF2/Si(111): Selective nucleation on electron-beam modified surfaces

Heim, K. R., Hembree, G. G., Scheinfein, M. R.
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Volume:
76
Year:
1994
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.357859
File:
PDF, 1.75 MB
english, 1994
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