[IEEE 2008 10th Electronics Packaging Technology Conference...

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[IEEE 2008 10th Electronics Packaging Technology Conference (EPTC) - Singapore, Singapore (2008.12.9-2008.12.12)] 2008 10th Electronics Packaging Technology Conference - Studies on the Thermal Cycling Reliability of Fine Pitch Cu/SnAg Double-Bump Flip Chip Assemblies on Organic Substrates: Experimental Results and Numerical Analysis

Son, Ho-Young, Paik, Kyung-Wook, Kim, Ilho, Park, Jin-Hyoung, Lee, Soon-Bok, Jung, Gi-Jo, Park, Byung-Jin, Byun, Kwang-Yoo
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Year:
2008
Language:
english
DOI:
10.1109/eptc.2008.4763517
File:
PDF, 9.46 MB
english, 2008
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