Thin layer composition profiling with angular resolved...

Thin layer composition profiling with angular resolved x-ray photoemission spectroscopy: Factors affecting quantitative results

Conard, T., Vandervorst, W., Bergmaier, A., Kimura, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4704603
File:
PDF, 1.30 MB
english, 2012
Conversion to is in progress
Conversion to is failed