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Multiple reflection high-energy electron diffraction beam intensity measurement system
Resh, J. S., Jamison, K. D., Strozier, J., Ignatiev, A.Volume:
61
Year:
1990
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1141492
File:
PDF, 625 KB
english, 1990