![](/img/cover-not-exists.png)
The use of diffuse reflectance infrared Fourier transform spectroscopy to monitor reactions in low-temperature films and matrices
Ian R. Dunkin, Sean L. GallivanVolume:
9
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0924-2031(94)00047-k
File:
PDF, 456 KB
english, 1995