[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF...

[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - An automatic harmonic selection scheme based on spectrum analyzer measurements

Rabijns, D., Vandersteen, G., Rolain, Y., Van Moer, W., Geens, A., Schoukens, J.

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Year:

2002

Language:

english

DOI:

10.1109/arftgf.2002.1218695

File:

PDF, 656 KB

english, 2002

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