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[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - An automatic harmonic selection scheme based on spectrum analyzer measurements
Rabijns, D., Vandersteen, G., Rolain, Y., Van Moer, W., Geens, A., Schoukens, J.Year:
2002
Language:
english
DOI:
10.1109/arftgf.2002.1218695
File:
PDF, 656 KB
english, 2002