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Kapitza resistance of Si/SiO2 interface
Deng, B., Khafizov, M., Hurley, D. H., Phillpot, S. R.Volume:
115
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4867047
Date:
February, 2014
File:
PDF, 1.72 MB
english, 2014