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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Design of a fault-tolerant coarse-grained
Jafri, Syed M. A. H., Piestrak, Stanislaw J., Sentieys, Olivier, Pillement, SebastienYear:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450481
File:
PDF, 224 KB
english, 2010