[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - In situ screening techniques for defective oxides in devices for automotive applications
Malandruccolo, V., Ciappa, M., Fichtner, W., Rothleitner, H.Year:
2011
Language:
english
DOI:
10.1109/irps.2011.5784447
File:
PDF, 609 KB
english, 2011