[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture
Wang, Sying-Jyan, Tsai, Po-Chang, Weng, Hung-Ming, Li, Katherine Shu-MinYear:
2007
Language:
english
DOI:
10.1109/ats.2007.33
File:
PDF, 278 KB
english, 2007