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Effect of ion induced damage on carrier lifetimes in strained CdZnSe/ZnSe quantum wells
Sparing, L. M., Mintairov, A. M., Hodak, J. H., Martini, I. B., Hartland, G. V., Bindley, U., Lee, S., Furdyna, J. K., Merz, J. L., Snider, G. L.Volume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.372300
File:
PDF, 307 KB
english, 2000