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[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Investigation of ESD devices in 0.18 μm SiGe BiCMOS process
Shiao-Shien Chen,, Tung-Yang Chen,, Tien-Hao Tang,, Tsun-Lai Hsu,, Hua-Chou Tseng,, Jen-Kon Chen,, Chiu-Hsiang Chou,Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197773
File:
PDF, 304 KB
english, 2003