[IEEE 2009 IEEE MTT-S International Microwave Symposium Digest (MTT) - Boston, MA, USA (2009.06.7-2009.06.12)] 2009 IEEE MTT-S International Microwave Symposium Digest - A six-port reflectometer for in-situ monitoring of frequency multipliers
Guoguang Wu,, Haiyong Xu,, Hesler, Jeffrey L., Lichtenberger, Arthur W., Weikle, Robert M.Year:
2009
Language:
english
DOI:
10.1109/mwsym.2009.5165854
File:
PDF, 1.41 MB
english, 2009