Depth analysis of the in-plane lattice constants in...

Depth analysis of the in-plane lattice constants in compressively strained La[sub 0.67]Ca[sub 0.33]MnO[sub 3] thin films

Petit, M., Rajeswari, M., Biswas, A., Greene, R. L., Venkatesan, T., Martínez-Miranda, L. J.
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Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1884761
File:
PDF, 339 KB
english, 2005
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