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Divacancy in silicon: Hyperfine interactions from electron-nuclear double-resonance measurements. II
Sieverts, E. G., Muller, S. H., Ammerlaan, C. A. J.Volume:
18
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.18.6834
Date:
December, 1978
File:
PDF, 986 KB
english, 1978