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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Trends and requirements of future high-performance CMOS
Khakifirooz, Ali, Antoniadis, Dimitri A.Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588142
File:
PDF, 362 KB
english, 2008