[IEEE 8th Euromicro Conference on Digital System Design (DSD'05) - Porto, Portugal (30-03 Aug. 2005)] 8th Euromicro Conference on Digital System Design (DSD'05) - Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BIST
Filter, P., Kubatova, H.Рік:
2005
Мова:
english
DOI:
10.1109/dsd.2005.51
Файл:
PDF, 318 KB
english, 2005