Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering
Schroer, C. G., Kuhlmann, M., Roth, S. V., Gehrke, R., Stribeck, N., Almendarez-Camarillo, A., Lengeler, B.Volume:
88
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2196062
File:
PDF, 534 KB
english, 2006