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[IEEE Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Portland, OR, USA (27-31 July 1997)] Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - QuickView: an assessment tool for small- to medium-sized manufacturing firms

Simons, G.R., Wallace, W.A., O'Keefe, R.M., Rush, R.
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Year:
1997
Language:
english
DOI:
10.1109/picmet.1997.653563
File:
PDF, 403 KB
english, 1997
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