[IEEE 1993 Fifth Annual IEEE International Conference on Wafer Scale Integration - San Francisco, CA, USA (20-22 Jan. 1993)] 1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration - Use of high dielectric constant insulators for bypass capacitance in WSI and wafer scale hybrid multichip modules
Philhower, R., Van Etten, J., Nah, K.S., Loy, C.J., Maier, C., Campbell, P., Grueb, H.J., Li, P., Liu, W.-T., Lu, T.-M., McDonald, J.F.Year:
1993
Language:
english
DOI:
10.1109/icwsi.1993.255246
File:
PDF, 602 KB
english, 1993