Device geometry and temperature dependence of deep level...

Device geometry and temperature dependence of deep level transient spectroscopy spectra of GaAs metal-semiconductor field-effect transistors

Zhao, J. H.
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Volume:
67
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.344995
File:
PDF, 576 KB
english, 1990
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