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[IEEE 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2012) - Montreal, QC, Canada (2012.10.14-2012.10.17)] 2012 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - A study of factors and mechanisms responsible for the de-metallization of polypropylene films used in dry capacitors
Kahouli, A., Lesaint, O., Gallot-Lavallee, O., Rain, P., Guillermin, C.Year:
2012
Language:
english
DOI:
10.1109/CEIDP.2012.6378874
File:
PDF, 1.02 MB
english, 2012