Radiation and bias switch-induced charge dynamics in Al2O3-based metal-oxide-semiconductor structures
Sambuco Salomone, L., Kasulin, A., Lipovetzky, J., Carbonetto, S. H., Garcia-Inza, M. A., Redin, E. G., Berbeglia, F., Campabadal, F., Faigón, A.Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4900851
Date:
November, 2014
File:
PDF, 877 KB
english, 2014