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[IEEE 2011 International Symposium on Electronic System Design (ISED) - Kochi, Kerala, India (2011.12.19-2011.12.21)] 2011 International Symposium on Electronic System Design - Statistical Blockade Method for Fast Robustness Estimation and Compensation of Nano-CMOS Arithmetic Circuits
Sun, Luo, Mathew, Jimson, Pradhan, Dhiraj K., Mohanty, Saraju P.Year:
2011
Language:
english
DOI:
10.1109/ised.2011.64
File:
PDF, 219 KB
english, 2011