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Characterization and testing of polymer-oxide adhesion to improve the packaging reliability of ISFETs
R.E.G. van Hal, P. Bergveld, J.F.J. Engbersen, D.N. ReinhoudtVolume:
23
Year:
1995
Pages:
10
DOI:
10.1016/0925-4005(94)01526-n
File:
PDF, 902 KB
1995